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High Resolution X-Ray Diffractometry And Topography
by High Resolution X-Ray Diffractometry And Topography
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Description
The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization.
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Product Details
- CRC Press Brand
- Oct 10, 2019 Pub Date:
- 0367400634 ISBN-10:
- 9780367400637 ISBN-13:
- English Language
- 9.5 in * 0.7 in * 6.8 in Dimensions:
- 1 lb Weight:
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