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Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxf

by Cullis, A G

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Description

Microscopy of Semiconducting Materials 1987 highlights the progress that is being made in semiconductor microscopy, primarily in electron probe methods as well as in light optical and ion scattering techniques. The book covers the state of the art, with sections on high resolution microscopy, epitaxial layers, quantum wells and superlattices, bulk gallium arsenide and other compounds, properties of dislocations, device silicon and dielectric structures, silicides and contacts, device testing, x-ray techniques, microanalysis, and advanced scanning microscopy techniques.

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Product Details

  • CRC Press Brand
  • Oct 1, 1987 Pub Date:
  • 0854981780 ISBN-10:
  • 9780854981786 ISBN-13:
  • English Language
  • 9.21 in * 1.69 in * 6.14 in Dimensions:
  • 3 lb Weight: