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(Ipf)Microelectronic Reliability
by Hakim, Edward B
$138.64
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Description
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
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Product Details
- Jan 31, 1989 Pub Date:
- 0890062846 ISBN-10:
- 9780890062845 ISBN-13:
- English Language
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