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Digital Hardware Testing: Transistor-Level Fault Modeling and Testing

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Description

Digital Hardware Testing presents realistic transistor-level fault models and testing methods for all types of circuits. The discussion details design-for-testability and built-in self-test methods, with coverage of boundary scan and emerging technologies such as partial scan, cross check, and circular self-test-path.

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Product Details

  • Dec 1, 1992 Pub Date:
  • 0890065802 ISBN-10:
  • 9780890065808 ISBN-13:
  • English Language