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Reliability and Degradation of III-V Optical Devices

by Ueda, Osamu

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Description

Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.

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Product Details

  • Artech House Publishers Brand
  • Sep 30, 1996 Pub Date:
  • 0890066523 ISBN-10:
  • 9780890066522 ISBN-13:
  • 372.0 pages Hardcover
  • English Language
  • 9.3 in * 0.95 in * 6.31 in Dimensions:
  • 1 lb Weight: