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Elements of Electromigration: Electromigration in 3D IC technology

by Elements of Electromigration: Electromigration in 3D IC technology

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Description

In this invaluable resource for graduate students and practicing professionals, Tu and Liu provide a comprehensive account of electromigration and give a practical guide on how to manage its effects in microelectronic devices, especially newer devices that make use of 3D architectures.

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Product Details

  • CRC Press Brand
  • Jan 19, 2024 Pub Date:
  • 1032470275 ISBN-10:
  • 9781032470276 ISBN-13:
  • English Language
  • 132.0 pages Hardcover
  • 9.69 in * 6.85 in * 0.37 in Dimensions:
  • 1 lb Weight: