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Focused Beam Methods Measuring Microwave Materials in Free Space

by [Schultz, John W]

$30.47

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Description

Determining the intrinsic microwave properties of materials is important for a variety of applications ranging from antenna and electronic circuit design to remote sensing to electromagnetic interference mitigation. A number of methods exist for characterizing intrinsic properties of materials at microwave frequencies, including transmission lines, resonant cavities, and impedance analysis. The use of free-space measurement methods has become commonplace among microwave material characterization laboratories due to its ease of use and reasonable accuracy. While some free-space facilities exist that can characterize down to 500 MHz, the method is most useful for characterizing materials from 2 GHz through millimeter waves. This book is designed to acquaint engineers and scientists with the theory and practice of using microwave focused beam systems for free-space characterization of materials.

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Product Details

  • CreateSpace Independent P Brand
  • Oct 15, 2012 Pub Date:
  • 9781480092853 ISBN-13:
  • 1480092851 ISBN-10:
  • English Language
  • 9.21 in * 0.34 in * 6.14 in Dimensions:
  • 1 lb Weight: