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Reliability of CMOS Analog ICS
by Kuntman, Hakan
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Description
This book presents recent advances in reliability investigation of MOS transistors and their applications. Theory and experimental results are discussed, in order to demonstrate the efficacy of the techniques presented. Readers will be enabled to improve their designs in application areas of analog signal processing, ranging from very low frequencies at several Hz levels of biomedical signals to RF applications operating at GHz level, from EEG signals to cognitive radio and encrypted communications or low-noise amplifiers in wireless communications.
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Product Details
- Jun 13, 2025 Pub Date:
- 3031854543 ISBN-10:
- 9783031854545 ISBN-13:
- English Language
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